-5 seconds Shot for full feature parameters
-The Multi-Stack Application for bumps
-Accurate and repeatable results
-Calculating cross wafer variation
-Pillar bumps metrology
-The metrology solution - XwinSys Onyx
-The Multi-Stack Application for bumps
-Accurate and repeatable results
-Calculating cross wafer variation
-Pillar bumps metrology
-The metrology solution - XwinSys Onyx