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XwinSys Recent Press Releases
Press Release
Rigaku Corporation and DYG Holdings LTD Announce Rigaku to Acquire XwinSys Technologies Development Ltd (XWS)
July 15th 2019
Press Release
XwinSys Publishes a New Article in Solid State Magazine
July 6th 2016
Unique In-line and non-destructive hybrid technology – a new standard for the semiconductor industry
Press Release
XwinSys will be participating in SEMICON West 2016
June 15th 2016
Patented Hybrid In-Line Metrology System to be Featured
Press Release
XwinSys Receives United States Patent
May 12th 2016
United States Patent Office Grants Process Patent
Press Release
XwinSys Announces Novel Solution for the Semiconductor Industry
February 23rd 2016
NMT: Noise-reduced Multilayer Thin-film Measurement System a Revolutionary Tool
Press Release
XwinSys Receives $300,000 Grant
December 1st 2014
Significant Progress in Bumps Inspection System for Semiconductor Manufacturing
Press Release
XwinSys Subsidiary Advancements
April 26th 2014
Press Release
XwinSys Receives $250,000 Grant
November 29th 2013
-Office of the Chief Scientist of Israel Supports Wafer Bumps Inspection and Measurement System-
Press Release
XwinSys Receives Development Grant
November 29th 2012
Press Release
Eurocontrol Technics Group Finalizes Acquisition of XwinSys Ltd.
May 7th 2012
-Partnership Will Bring New Verification Technology to the Semiconductor Industry-
news & events
15/07/2019
Rigaku Corporation and DYG Holdings LTD Announce Rigaku...
13/08/2017
Copper Pillar Bumps Layers Thickness
10/05/2017
Onyx Hybrid Metrology - System Automatic Health Monitoring
05/03/2017
XwinSys At SEMICON Southeast Asia 2017
14/07/2016
XwinSys at SEMICON West 2016
06/07/2016
XwinSys Publishes a New Article in Solid State...
15/06/2016
XwinSys will be participating in SEMICON West 2016
12/05/2016
XwinSys Receives United States Patent
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Home
Solutions
Film Stack
Ultra-Thin Films Measurement
Light Elements Detection
UBM / RDL: Thickness Monitoring
Bump Inspection - Composition & Height
Real Time Review - Detection & Metrology
Products & Technology
Onyx
Agate
Sapphire
XRF Analysis
3D Scanner
2D Microscope
Support
About Us
Company Overview
Leadership
Careers
News & Events
Press Release
Events
Newsletters & App notes
Articles
Contact Us