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Israel
Headquarters

E-mail: info@xwinsys.com
Tel: +972-4-9891313
Fax: +972-4-9891323
Address: Ramat Gabriel Industrial Zone, 6 Hatikshoret St. Migdal Haemek 2307049, Israel
Letters: P.O.B. 997 Migdal Haemek 2310901, Israel

USA
US Office

Mr. Brad Lawrence
E-mail: brad.l@xwinsys.com
Tel: +01-602-460-4286
Fax: +01-602-297-6563
Address: P.O. Box 211, Salome, AZ 85348, USA

news & events

  • 15/07/2019Rigaku Corporation and DYG Holdings LTD Announce Rigaku...
  • 13/08/2017Copper Pillar Bumps Layers Thickness
  • 10/05/2017Onyx Hybrid Metrology - System Automatic Health Monitoring
  • 05/03/2017XwinSys At SEMICON Southeast Asia 2017
  • 14/07/2016XwinSys at SEMICON West 2016
  • 06/07/2016XwinSys Publishes a New Article in Solid State...
  • 15/06/2016XwinSys will be participating in SEMICON West 2016
  • 12/05/2016XwinSys Receives United States Patent
More News & Events by XwinSys

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Contact Information

Address: Ramat Gabriel Industrial Zone, 6 Hatikshoret St., P.O.B. 997, Migdal Haemek 2310901, Israel
Tel: +972-4-9891313
Fax: +972-4-9891323
E-mail: info@xwinsys.com
Privacy |  Terms |  Disclaimer
Solutions
Film Stack
Ultra-Thin Films Measurement
Light Elements Detection
UBM / RDL: Thickness Monitoring
Bump Inspection - Composition & Height
Real Time Review - Detection & Metrology
Products & Technology
Onyx
Agate
Sapphire
XRF Analysis
3D Scanner
2D Microscope
About Us
Company Overview
Leadership
Careers
Support
News & Events
Press Release
Events
Newsletters & App notes
Articles
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bulletHome
bulletSolutions
Film Stack
Ultra-Thin Films Measurement
Light Elements Detection
UBM / RDL: Thickness Monitoring
Bump Inspection - Composition & Height
Real Time Review - Detection & Metrology
bulletProducts & Technology
Onyx
Agate
Sapphire
XRF Analysis
3D Scanner
2D Microscope
bulletSupport
bulletAbout Us
Company Overview
Leadership
Careers
bulletNews & Events
Press Release
Events
Newsletters & App notes
Articles
bulletContact Us