XwinSys Solutions

Real Time Review - Detection & Metrology

Integrated 3D and 2D metrology and inspection in a single system.

Detection and metrology integrated in a single system obtains a precise, stable measurement of a wide range of shapes and materials, providing improved cost effective solution.

Innovative image acquisition technology to achieve better detection capabilities.

Detection of defects and miss-processes complemented with in-depth metrology: Reliable and quantitative analysis of voids, missing layers and features.

  • Measurement of bump dimensions and precise location
  • Inspection of surface defects for a wider range of configurations
  • Detection of voids by obtaining 3D volume, elemental volume and composition
Real Time Review - Detection & Metrology

Compatible Systems

Onyx
In-line non-destructive inspection and metrology for the semiconductor and micro-electronic industries.
Agate
Non-destructive inspection and metrology for the semiconductor and micro-electronic industries.