News & Events

Get to know XwinSys upcoming new & events

    April 25-27, 2017 SPICE Arena, Penang - Malaysia
    SEMICON West 2016 has started.
    Unique In-line and non-destructive hybrid technology – a new standard for the semiconductor industry
    Patented Hybrid In-Line Metrology System to be Featured
    United States Patent Office Grants Process Patent
    NMT: Noise-reduced Multilayer Thin-film Measurement System a Revolutionary Tool
    Wonderful Holday Season & Happy New Year
    Wishing you a wondeful holiday season & happy new year!
    Significant Progress in Bumps Inspection System for Semiconductor Manufacturing
    WE are pleased to announce the launch of a state-of-the-art web-based database of the X-Ray Fluorescence (XRF) spectroscopy field available at www.learnxrf.com